dor_id: 4128563
506.#.#.a: Público
590.#.#.d: Cada artículo es evaluado mediante una revisión ciega única. Los revisores son externos nacionales e internacionales.
510.0.#.a: Web of Science (WoS), Directory of Open Access Journals (DOAJ), Sistema Regional de Información en Línea para Revistas Científicas de América Latina, el Caribe, España y Portugal (Latindex), Scientific Electronic Library Online (SciELO), Consejo Nacional de Ciencia y Tecnología (CONACyT), La Red de Revistas Científicas de América Latina y el Caribe, España y Portugal (Redalyc)
561.#.#.u: https://www.fciencias.unam.mx/
650.#.4.x: Físico Matemáticas y Ciencias de la Tierra
336.#.#.b: article
336.#.#.3: Artículo de Investigación
336.#.#.a: Artículo
351.#.#.6: https://rmf.smf.mx/ojs/rmf/index
351.#.#.b: Revista Mexicana de Física
351.#.#.a: Artículos
270.1.#.p: Revistas UNAM. Dirección General de Publicaciones y Fomento Editorial, UNAM en revistas@unam.mx
590.#.#.c: Open Journal Systems (OJS)
270.#.#.d: MX
270.1.#.d: México
590.#.#.b: Concentrador
883.#.#.u: http://www.revistas.unam.mx/front/
883.#.#.a: Revistas UNAM
590.#.#.a: Coordinación de Difusión Cultural, UNAM
883.#.#.1: https://www.publicaciones.unam.mx/
883.#.#.q: Dirección General de Publicaciones y Fomento Editorial, UNAM
850.#.#.a: Universidad Nacional Autónoma de México
856.4.0.u: https://rmf.smf.mx/ojs/index.php/rmf/article/view/Vol.%2064%2C%20Issue%203%2C%20pp.%20206-215/89
100.1.#.a: Castillo Ojeda, R. S.; Díaz Reyes, Joel; Galván Arellano, M.; Rivera Hernández, K. N.; Villa Ramírez, M. S.; Luna Suárez, S.
524.#.#.a: Castillo Ojeda, R. S., et al. (2018). Growth and characterization of Cd1-xZnxTe (0 \leq x \leq 1) nanolayers grown by isothermal closed space atomic layer deposition on GaSb and GaAs. Revista Mexicana de Física; Vol. 64 No. 3, 2018; 206-215. Recuperado de https://repositorio.unam.mx/contenidos/4128563
245.1.0.a: Growth and characterization of Cd1-xZnxTe (0 \leq x \leq 1) nanolayers grown by isothermal closed space atomic layer deposition on GaSb and GaAs
502.#.#.c: Universidad Nacional Autónoma de México
561.1.#.a: Facultad de Ciencias, UNAM
264.#.0.c: 2018
264.#.1.c: 2018-04-30
653.#.#.a: Iii-v substrates; cd1-xznxte ternary alloy; zn; te and cd mixture of elements; atomic layer deposition (ald); defect generation mechanism.
506.1.#.a: La titularidad de los derechos patrimoniales de esta obra pertenece a las instituciones editoras. Su uso se rige por una licencia Creative Commons BY-NC-ND 4.0 Internacional, https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es, fecha de asignación de la licencia 2018-04-30, para un uso diferente consultar al responsable jurídico del repositorio por medio del correo electrónico rmf@ciencias.unam.mx
884.#.#.k: https://rmf.smf.mx/ojs/index.php/rmf/article/view/Vol.%2064%2C%20Issue%203%2C%20pp.%20206-215
001.#.#.#: rmf.oai:ojs2.rmf.smf.mx:article/228
041.#.7.h: eng
520.3.#.a: In this work are presented the results obtained from the deposition of Cd1-xZnxTe nanolayers using as precursor the vapours of the elements Zn, Te, and a mixture of Cd and Zn on GaAs and GaSb (001) substrates by Atomic Layer Deposition technique (ALD), which allows the deposition of layers of nanometric dimensions. At each exposure of the growth surface to the of cation or anion precursors vapours, this surface is saturated. Therefore, it is considered that the process is self-regulated. The ZnTe layers were grown in a wide range of temperatures; however, ZnTe nanolayers with a shiny mirror-like surface could be grown at temperatures between 370 and 410oC. Temperatures higher than 400oC were necessary for the CdTe growth. The layers of the Cd1-xZnxTe ternary alloy were deposited at temperature range of 400 and 425oC. The grown nanofilms were characterized by Raman spectroscopy and high-resolution X-ray diffraction. The Raman spectrum shows the peak corresponding to LO-ZnTe at 208 cm-1, which is weak and is slightly redshifted in comparison with the reported for the bulk ZnTe. For the case of the CdTe nanolayers, Raman spectrum presents the LO-CdTe peak, which is indicative of the successfully growth of the nanolayers, its weakness and its slight redshifted in comparison with the reported for the bulk CdTe can be related with the nanometric characteristic of this layer. The performed high resolution X-ray diffraction measurements allowed to study some important characteristics, as the crystallinity of the grown layers. Additionally, the performed HR-XRD measurements suggest that the crystalline quality have dependence with the growth temperature.
773.1.#.t: Revista Mexicana de Física; Vol. 64 No. 3 (2018); 206-215
773.1.#.o: https://rmf.smf.mx/ojs/rmf/index
022.#.#.a: ISSN electrónico: 2683-2224; ISSN impreso: 0035-001X
310.#.#.a: Bimestral
300.#.#.a: Páginas: 206-215
264.#.1.b: Facultad de Ciencias, UNAM
758.#.#.1: https://rmf.smf.mx/ojs/rmf/index
doi: https://doi.org/10.31349/RevMexFis.64.206
handle: 17442c59a03d902a
harvesting_date: 2022-08-17 16:00:00.0
856.#.0.q: application/pdf
file_creation_date: 2018-02-28 20:39:15.0
file_name: cae8b33b3bec0b5f1ea37b57611323d8e2f9fa8daabfacf1991556d3dd053e08.pdf
file_pages_number: 10
file_format_version: application/pdf; version=1.2
file_size: 5125465
last_modified: 2022-11-29 12:00:00
license_url: https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode.es
license_type: by-nc-nd
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